TON
Framework Type TON
Powder Diffraction Pattern for Diethylamine Theta-1 (Silica ZSM-22)
Set Parameters:
 2θ range:
-
°Step size:
 Background:  Polarization factor:
 Wavelength:
 Peak shape parameters (The pattern is calculated using a pseudo Voigt function with FWHM = sqrt(U + V tan θ + W tan2θ)) :
  Peak range: FWHMMixing parameter: % 
  Peak width: calculate UVW such that
    U =  FWHM =
    V =  FWHM =  
    W =  FWHM =  
 Intensity scale:   
  Reference peak, scaled to , is the  
   peak closest to °2θ reflection (hkl)
 Plot parameters:      
  Output:Size:Intensity axis:
-
 
List hkl and intensity
plot powder pattern

Crystal data:
Composition:|(C2H5)2NH| [Si24O48]
Refined composition: |C5.1| [Si24O48]
Space group: Cmc21  (# 36)  Setting:
Cell parameters:a = 13.859Åb = 17.420Åc = 5.038Å
 α = 90°β = 90°γ = 90°
Refinement:X-ray single crystal refinement, Rw=0.056
Reference:Marler, B.
Zeolites, 7, 393-397 (1987)


Atomic Coordinates:      
 
Atom
Form Factor
x
y
z
PP
B(iso)
  
SI1
Si
0.00000.27370.251.00.67
SI2
Si
0.00000.37680.74651.00.58
SI3
Si
0.29510.04820.22651.00.80
SI4
Si
0.20550.21120.14451.00.58
O1
O
0.09230.42680.69771.01.47
O2
O
0.09420.22240.20681.01.90
O3
O
0.27120.37890.66391.01.88
O4
O
0.22880.48000.02341.01.05
O5
O
0.27050.25840.35351.01.48
O6
O
0.00.30620.54411.01.60
O7
O
0.00.34500.04931.01.45
C1
C
0.50.51950.13630.57522.11
C2
C
0.50.51240.34580.722.11


Copyright © 2007 Structure Commission of the International Zeolite Association (IZA-SC)