GON
Framework Type
GON
Powder Diffraction Pattern for GUS-1
Set Parameters:
2θ range:
°
-
°
Step size:
°2θ
Background:
Polarization factor:
Wavelength:
As specified
CrA1 (2.28970 Å)
CrA2 (2.29361 Å)
Cr (2.29090 Å)
FeA1 (1.93604 Å)
FeA2 (1.93998 Å)
Fe (1.93730 Å)
CuA1 (1.54056 Å)
CuA2 (1.54439 Å)
Cu (1.54180 Å)
MoA1 (0.70930 Å)
MoA2 (0.71359 Å)
Mo (0.71070 Å)
AgA1 (0.55941 Å)
AgA2 (0.56380 Å)
Ag (0.56080 Å)
or
Å
keV
Peak shape parameters
(The pattern is calculated using a pseudo Voigt function with FWHM = sqrt(U + V tan θ + W tan
2
θ))
:
Peak range:
FWHM
Mixing parameter:
%
Peak width:
set UVW at
calculate UVW such that
U =
FWHM =
at
°2θ
V =
FWHM =
at
°2θ
W =
FWHM =
at
°2θ
Intensity scale:
Reference peak, scaled to
,
is the
highest peak in 2θ range
peak closest to
°2θ
reflection (hkl)
Plot parameters:
Output:
on screen
Postscript
HP-GL
ASCII
Size:
small (410x310)
medium (640x480)
large (880x650)
Intensity axis:
-
List hkl and intensity
plot powder pattern
Crystal data:
Composition:
[
Si
32
O
64
]
Refined composition:
[
Si
32
O
64
]
Space group:
C222
(# 21)
Setting:
Cell parameters:
a
=
16.4206Å
b
=
20.0540Å
c
=
5.0464Å
α =
90.0°
β =
90.0°
γ =
90.0°
Refinement:
X-ray powder diffraction.
Reference:
Plévert, J., Kubota, Y., Honda, T., Okubo, T. and Sugi, Y.
Chem. Commun.
,
, 2363-2364 (2000)
Atomic Coordinates:
Atom
Form Factor
x
y
z
PP
B(iso)
Si1
Si
0.3074
0.1879
0.478
1.0
1.97
Si2
Si
0.1818
0.0767
0.527
1.0
1.97
Si3
Si
0.0937
0.1222
0.016
1.0
1.97
Si4
Si
0.0964
0.2819
-0.002
1.0
1.97
O1
O
0.3549
0.1874
0.754
1.0
2.37
O2
O
0.384
0.2092
0.307
1.0
2.37
O3
O
0.25
0.25
0.522
1.0
2.37
O4
O
0.2644
0.1170
0.477
1.0
2.37
O5
O
0.1537
0.0785
0.834
1.0
2.37
O6
O
0.212
0.0
0.5
1.0
2.37
O7
O
0.1151
0.1023
0.317
1.0
2.37
O8
O
0.0
0.1006
0.0
1.0
2.37
O9
O
0.1021
0.2021
-0.013
1.0
2.37
O10
O
0.0
0.297
0.0
1.0
2.37
Copyright © 2007 Structure Commission of the International Zeolite Association (
IZA-SC
)
