AFX
Framework Type AFX
Powder Diffraction Pattern for SAPO-56
Set Parameters:
 2θ range:
-
°Step size:
 Background:  Polarization factor:
 Wavelength:
 Peak shape parameters (The pattern is calculated using a pseudo Voigt function with FWHM = sqrt(U + V tan θ + W tan2θ)) :
  Peak range: FWHMMixing parameter: % 
  Peak width: calculate UVW such that
    U =  FWHM =
    V =  FWHM =  
    W =  FWHM =  
 Intensity scale:   
  Reference peak, scaled to , is the  
   peak closest to °2θ reflection (hkl)
 Plot parameters:      
  Output:Size:Intensity axis:
-
 
List hkl and intensity
plot powder pattern

Crystal data:
Composition:[Si5Al23P20O96]
Refined composition: [Al24P24O96]
Space group: P-31c  (# 163)  Setting:
Cell parameters:a = 13.7617Åb = 13.7617Åc = 19.949Å
 α = 90°β = 90°γ = 120°
Refinement:X-ray Rietveld refinement, Rexp=0.068, Rwp=0.219
Reference:McGuire, N.K., Blackwell, C.S., Bateman, C.A., Wilson, S.T. and Kirchner, R.M.
private communication, , ()


Atomic Coordinates:      
 
Atom
Form Factor
x
y
z
PP
B(iso)
  


Copyright © 2007 Structure Commission of the International Zeolite Association (IZA-SC)